Title:
TEST BOARD, TEST SYSTEM AND TEST METHOD
Document Type and Number:
WIPO Patent Application WO/2023/040253
Kind Code:
A1
Abstract:
Embodiments of the present disclosure provide a test board, a test system and a test method. The test board comprises a register clock driver (RCD) module and a memory to be tested, and an output terminal of the RCD module is connected to an input terminal of the memory, wherein the RCD module is used to determine a target test instruction, and send the target test instruction to the memory after entering an offline mode; and the memory is used to receive the target test instruction, and output a test result according to the target test instruction. Thus, the embodiments of the present disclosure provide a test board supported in an offline mode, which allows the memory to be tested separate from a main board of the system, and may conveniently modify test-related parameters and improve the flexibility and efficiency of the test.
Inventors:
QIAN JIN (CN)
MA MAOSONG (CN)
SHI HONGLONG (CN)
MA MAOSONG (CN)
SHI HONGLONG (CN)
Application Number:
PCT/CN2022/087047
Publication Date:
March 23, 2023
Filing Date:
April 15, 2022
Export Citation:
Assignee:
CHANGXIN MEMORY TECH INC (CN)
International Classes:
G11C29/56
Foreign References:
| US20190237152A1 | 2019-08-01 | |||
| US20110302467A1 | 2011-12-08 | |||
| US20190115053A1 | 2019-04-18 | |||
| US20060095817A1 | 2006-05-04 | |||
| US20140071785A1 | 2014-03-13 | |||
| US20060036916A1 | 2006-02-16 |
Attorney, Agent or Firm:
CHINA PAT INTELLECTUAL PROPERTY OFFICE (CN)
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