Title:
TEST CHART, AND CAMERA MANUFACTURING APPARATUS
Document Type and Number:
WIPO Patent Application WO/2023/145421
Kind Code:
A1
Abstract:
The present invention suppresses a decrease in the accuracy of detection of a focus position. A test chart for adjusting a camera is provided, comprising: a first sloped surface having a pattern in which light is radiated; a second sloped surface having a pattern in which light is radiated and disposed adjacent to the first sloped surface; and a light blocking portion that is provided between the first sloped surface and the second sloped surface, and that blocks at least light traveling from the pattern of the first sloped surface toward the second sloped surface.
Inventors:
NEGISHI MAHITO (JP)
Application Number:
PCT/JP2023/000362
Publication Date:
August 03, 2023
Filing Date:
January 11, 2023
Export Citation:
Assignee:
CCTECH JAPAN CO LTD (JP)
International Classes:
H04N23/60; G02B7/28; G03B17/02
Domestic Patent References:
| WO2020188761A1 | 2020-09-24 |
Foreign References:
| JPH0969973A | 1997-03-11 | |||
| JP2015072444A | 2015-04-16 |
Attorney, Agent or Firm:
TRY INTERNATIONAL IP LAW FIRM (JP)
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