Title:
TEST CIRCUIT AND TEST METHOD FOR DISPLAY PANEL
Document Type and Number:
WIPO Patent Application WO/2018/233068
Kind Code:
A1
Abstract:
A test circuit and test method for a display panel. The test circuit comprises: multiple switch units; multiple first test lead wires; multiple first test pads; and a second test pad and second test lead wire, wherein the numbers of the switch units, the first test lead wires, and the first test pads are identical, and each of the first test lead wires is configured to be electrically connected to a corresponding display panel. Each of the first test pads is electrically connected to an output end of the corresponding switch unit, and to the corresponding first test lead wire. The second test pad and second test lead wire are electrically connected to input ends of the multiple switch units.
Inventors:
CHEN YU-JEN (CN)
Application Number:
PCT/CN2017/100254
Publication Date:
December 27, 2018
Filing Date:
September 01, 2017
Export Citation:
Assignee:
HKC CORP LTD (CN)
CHONGQING HKC OPTOELECTRONICS TECH CO LTD (CN)
CHONGQING HKC OPTOELECTRONICS TECH CO LTD (CN)
International Classes:
G02F1/1337
Foreign References:
| CN107065313A | 2017-08-18 | |||
| CN101847357A | 2010-09-29 | |||
| CN101303462A | 2008-11-12 | |||
| CN102789076A | 2012-11-21 | |||
| CN106338863A | 2017-01-18 | |||
| US20080137021A1 | 2008-06-12 |
Attorney, Agent or Firm:
BEYOND ATTORNEYS AT LAW (CN)
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