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Title:
TEST SYSTEM AND TEST APPARATUS
Document Type and Number:
WIPO Patent Application WO/2023/065194
Kind Code:
A1
Abstract:
A test system (300, 400, 500, 600, 700) and a test apparatus. The test system (300, 400, 500, 600, 700) comprises: one or more modules to be tested; a control center, which is used for managing a control module and the one or more modules to be tested; a power supply center (320, 420, 520, 620, 720), which is used for providing a power supply for the test system (300, 400, 500, 600, 700); a signal and power supply distribution module (330, 430, 530, 630, 730), comprising a signal distribution module (331, 431, 531, 631, 731) and a power supply distribution module (332, 432, 532, 632, 732), wherein the signal distribution module (331, 431, 531, 631, 731) is used for issuing an instruction to the control module according to data of the control center, and the power supply distribution module (332, 432, 532, 632, 732) is used for providing the power supply of the power supply center (320, 420, 520, 620, 720) to the control module and the one or more modules to be tested; and the control module, which is used for receiving the instruction so as to manage the one or more modules to be tested, so that the integration level of the test system can be improved, and the test efficiency is further improved.

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Inventors:
WANG JIAQI (CN)
LIU QIMENG (CN)
ZHONG LONGPING (CN)
XIONG HUAQING (CN)
ZHOU TINGTING (CN)
Application Number:
PCT/CN2021/125133
Publication Date:
April 27, 2023
Filing Date:
October 21, 2021
Export Citation:
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Assignee:
HUAWEI TECH CO LTD (CN)
International Classes:
G01R31/303; G01R31/00; G01R31/28
Domestic Patent References:
WO2019194369A12019-10-10
Foreign References:
CN106019039A2016-10-12
CN107907773A2018-04-13
CN110794236A2020-02-14
CN204129649U2015-01-28
CN106209482A2016-12-07
CN201726066U2011-01-26
CN205176215U2016-04-20
Attorney, Agent or Firm:
LONGSUN LEAD IP LTD. (CN)
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