Title:
TESTING APPARATUS, TESTING METHOD, JITTER FILTER CIRCUIT AND JITTER FILTERING METHOD
Document Type and Number:
WIPO Patent Application WO/2007/123055
Kind Code:
A1
Abstract:
Provided is a testing apparatus for evaluating devices to be tested. The testing
apparatus is provided with an extracting section for extracting a jitter component
from an output signal outputted from the device to be tested; a filter for passing
through a prescribed frequency component in the jitter component; a phase control
section for controlling the phase of the output signal, based on the jitter component
outputted from the filter; and an evaluating section for evaluating the device
to be tested, based on a signal outputted from the phase control section.
Inventors:
ISHIDA MASAHIRO (JP)
ICHIYAMA KIYOTAKA (JP)
YAMAGUCHI TAKAHIRO (JP)
ICHIYAMA KIYOTAKA (JP)
YAMAGUCHI TAKAHIRO (JP)
Application Number:
PCT/JP2007/058117
Publication Date:
November 01, 2007
Filing Date:
April 12, 2007
Export Citation:
Assignee:
ADVANTEST CORP (JP)
ISHIDA MASAHIRO (JP)
ICHIYAMA KIYOTAKA (JP)
YAMAGUCHI TAKAHIRO (JP)
ISHIDA MASAHIRO (JP)
ICHIYAMA KIYOTAKA (JP)
YAMAGUCHI TAKAHIRO (JP)
International Classes:
G01R29/02; G01R23/165; G01R23/175; G01R29/18; G01R31/28
Domestic Patent References:
| WO2004031784A1 | 2004-04-15 | |||
| WO2006100745A1 | 2006-09-28 |
Foreign References:
| JP2005285160A | 2005-10-13 | |||
| JP2003272380A | 2003-09-26 | |||
| JP2005049233A | 2005-02-24 | |||
| JPH0575573A | 1993-03-26 |
Attorney, Agent or Firm:
RYUKA, Akihiro (22-1 Nishi-Shinjuku 6-chome,Shinjuku-ku, Tokyo 05, JP)
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