Title:
TESTING DEVICE AND TESTING METHOD
Document Type and Number:
WIPO Patent Application WO/2015/190537
Kind Code:
A1
Abstract:
Provided are a testing device and testing method having excellent portability whereby a device for detecting an arc discharge can be calibrated and the operation thereof confirmed easily and inexpensively. A testing device according to an embodiment of the present invention is provided with an optical semiconductor element for emitting light including ultraviolet light, and a luminescence control unit for causing the optical semiconductor element to emit light for a predetermined time in response to a luminescence start signal, the luminescence control unit being provided with an oscillator for oscillating at a predetermined oscillation frequency, a counter for starting counting in response to an oscillation output of the oscillator and stopping counting when the count value reaches a predetermined set value, and a drive circuit for driving the optical semiconductor element on the basis of the counting result of the counter.
Inventors:
HAYASAKA TAKAMASA (JP)
SHIMIZU MASATOSHI (JP)
TAKEUCHI MASARU (JP)
YOSHIHARA MAKOTO (JP)
SHIMIZU MASATOSHI (JP)
TAKEUCHI MASARU (JP)
YOSHIHARA MAKOTO (JP)
Application Number:
PCT/JP2015/066789
Publication Date:
December 17, 2015
Filing Date:
June 10, 2015
Export Citation:
Assignee:
RAILWAY TECHNICAL RES INST (JP)
DENGYO INC (JP)
DENGYO INC (JP)
International Classes:
G01J1/00; B60L5/00; B60M1/12; G01J1/02
Foreign References:
JP2010275841A | 2010-12-09 | |||
JP2010153151A | 2010-07-08 | |||
JPS6054094A | 1985-03-28 | |||
JP2002329591A | 2002-11-15 | |||
JP2007290329A | 2007-11-08 |
Other References:
TAKAMASA HAYASAKA: "Basic Property of Ultraviolet Ray Detection System", HEISEI 24 NEN THE INSTITUTE OF ELECTRICAL ENGINEERS OF JAPAN SANGYO OYO BUMON TAIKAI, 21 August 2012 (2012-08-21), pages V-215 - V-218
Attorney, Agent or Firm:
SHIGA Masatake et al. (JP)
Masatake Shiga (JP)
Masatake Shiga (JP)
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