Title:
THERMAL ANALYSIS DEVICE AND CONTROL SOFTWARE FOR THERMAL ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2024/043229
Kind Code:
A1
Abstract:
Provided is a thermal analysis device with which it is possible to easily perform detailed analysis of a change in the state of a specimen, while visually grasping, in detail, the color of the specimen and a change therein which accompanies a change in the temperature of the specimen. Also provided is a control software for the thermal analysis device. This thermal analysis device which acquires thermal analysis data by measuring and calculating the physical properties of a specimen while changing the temperature of the specimen by heating or cooling, and acquires image data by imaging the specimen, comprises: a means for displaying a graph pertaining to the temperature or time of the thermal analysis data; a means for displaying a specimen image which is the image data; a means for generating color information data for a type and range selected from the specimen image; and a means for displaying colors generated on the basis of the color information data as a gradation in which the colors are associated with a temperature or time and arranged.
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Inventors:
NORITAKE KOICHIRO (JP)
MATSUO SHUICHI (JP)
MATSUO SHUICHI (JP)
Application Number:
PCT/JP2023/030116
Publication Date:
February 29, 2024
Filing Date:
August 22, 2023
Export Citation:
Assignee:
RIGAKU CORPORAION (JP)
International Classes:
G01N25/20; G01N21/27; G01N25/00
Domestic Patent References:
| WO2017033526A1 | 2017-03-02 |
Foreign References:
| JP2021001870A | 2021-01-07 | |||
| JP2016118397A | 2016-06-30 |
Attorney, Agent or Firm:
SAGI Takeshi et al. (JP)
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