Title:
THIN FILM TRANSISTOR SUBSTRATE PROVIDED WITH PROTECTIVE FILM AND METHOD FOR PRODUCING SAME
Document Type and Number:
WIPO Patent Application WO/2018/097284
Kind Code:
A1
Abstract:
[Problem] To provide a thin film transistor substrate which is provided with a protective film, and which enables the achievement of high driving stability.
[Solution] A thin film transistor substrate which comprises a thin film transistor and a protective film that is formed of a cured product of a siloxane composition and covers the thin film transistor. This thin film transistor substrate is characterized in that: the thin film transistor has a semiconductor layer that is formed of an oxide semiconductor; and the siloxane composition contains a polysiloxane, a fluorine-containing compound and a solvent.
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Inventors:
URAOKA YUKIHARU (JP)
ISHIKAWA YASUAKI (JP)
YOSHIDA NAOFUMI (JP)
TANIGUCHI KATSUTO (JP)
NONAKA TOSHIAKI (JP)
ISHIKAWA YASUAKI (JP)
YOSHIDA NAOFUMI (JP)
TANIGUCHI KATSUTO (JP)
NONAKA TOSHIAKI (JP)
Application Number:
PCT/JP2017/042381
Publication Date:
May 31, 2018
Filing Date:
November 27, 2017
Export Citation:
Assignee:
NARA INSTITUTE OF SCIENCE AND TECHNOLOGY NATIONAL UNIV CORPORATION (JP)
MERCK PATENT GMBH (DE)
MERCK PATENT GMBH (DE)
International Classes:
C08G77/04; H01L21/336; C09D183/04; H01L21/312; H01L29/786
Domestic Patent References:
WO2013187507A1 | 2013-12-19 | |||
WO2009075233A1 | 2009-06-18 | |||
WO2016152090A1 | 2016-09-29 |
Foreign References:
JP2015146332A | 2015-08-13 | |||
JP2011100980A | 2011-05-19 |
Attorney, Agent or Firm:
NAGAI Hiroshi et al. (JP)
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