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Title:
VERIFICATION PROCESSING DEVICE, VERIFICATION PROCESSING METHOD, AND PROGRAM
Document Type and Number:
WIPO Patent Application WO/2021/246050
Kind Code:
A1
Abstract:
This verification processing device is provided with: an inspection unit that performs model inspection on an inspection target model including a plurality of elements; a selection unit that selects at least one of the plurality of elements included in a counterexample outputted as a result of the model inspection; and an exclusion history generation unit that generates exclusion history information indicating an exclusion frequency for each of the plurality of elements. The inspection unit further performs another model inspection on the inspection target model obtained by excluding the selected element. When another counterexample has been outputted as a result of another model inspection, the exclusion history generation unit increases the exclusion frequency of the selected element and updates the exclusion history information. The selection unit selects an element that is high in the exclusion frequency, on the basis of the exclusion history information.

Inventors:
HIRAYAMA KEITA (JP)
TAKAO KENJI (JP)
MASUMORI KENTA (JP)
Application Number:
PCT/JP2021/014748
Publication Date:
December 09, 2021
Filing Date:
April 07, 2021
Export Citation:
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Assignee:
MITSUBISHI HEAVY IND ENG LTD (JP)
International Classes:
G05B23/02; G01R31/00; G01R31/50; G06F11/22; G06F11/36
Domestic Patent References:
WO2020090345A12020-05-07
Foreign References:
JP2016177666A2016-10-06
Other References:
AOKI, YOSHITAKA ET AL.: "A method for detecting defects of program based on model checking techniques for development site", IEICE TECHNICAL REPORT, vol. 111, no. 396, 16 January 2012 (2012-01-16), pages 43 - 48, XP009532786, ISSN: 0913-5685
MORIKAWA, IKUYA ET AL.: "A method of detecting security flaws in Web sessions through model checking", IEICE TECHNICAL REPORT, vol. 107, no. 5, 12 April 2007 (2007-04-12), pages 29 - 34, XP009532785, ISSN: 0913-5685
Attorney, Agent or Firm:
MATSUNUMA Yasushi et al. (JP)
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