Title:
X-RAY FLUORESCENCE ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/004000
Kind Code:
A1
Abstract:
Provided is an X-ray fluorescence analysis device that makes it possible to reduce the consumption of gas composing a measurement atmosphere. An X-ray fluorescence analysis device (1) comprises a sample chamber (11) within which a sample (41) is placed, a measurement chamber (12) that is disposed so as to be adjacent to the sample (41) in the sample chamber (11), an X-ray tube (20) for irradiating the sample (11) with X-rays (23), and a detector (30) for detecting X-rays (23) that have been reflected by the sample (41), wherein the detector (30) is provided with a passage (36) that is positioned within the measurement chamber (12) and that reflected X-rays (23) pass through and a hole (33) connecting the passage (36) and the outside of the detector (30).
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Inventors:
MORIHISA YUJI (JP)
Application Number:
PCT/JP2020/045375
Publication Date:
January 06, 2022
Filing Date:
December 07, 2020
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
G01N23/223
Domestic Patent References:
| WO2014192173A1 | 2014-12-04 |
Foreign References:
| CN109239117A | 2019-01-18 | |||
| JP2005098906A | 2005-04-14 | |||
| JP2020085826A | 2020-06-04 | |||
| JPH10221047A | 1998-08-21 | |||
| JPH10160691A | 1998-06-19 | |||
| US20050129174A1 | 2005-06-16 |
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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