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Title:
X-RAY FLUORESCENCE ANALYSIS DEVICE
Document Type and Number:
WIPO Patent Application WO/2022/259667
Kind Code:
A1
Abstract:
An X-ray fluorescence analysis device according to the present invention comprises a quantitative means (13) that uses the FP method, the quantitative means (13) executing: an intensity ratio instrument sensitivity curve creation step for creating an intensity ratio instrument sensitivity curve that is a correlation between a measured intensity ratio, which is the ratio of the measured intensity of the contrasting principal component to the measured intensity of a reference principal component, and a theoretical intensity ratio, which is the ratio of the theoretical intensity of the contrasting principal component to the theoretical intensity of the reference principal component; an intensity ratio conversion step for converting the measured intensity ratio into a theoretical intensity scale on the basis of the intensity ratio instrument sensitivity curve to obtain a converted measured intensity ratio; a content ratio update step for updating the content ratio, which is the ratio of the content of the contrasting principal component to the content of the reference principal component, on the basis of the converted measured intensity ratio; and a content update step for updating the content of each component on the basis of the latest content ratio.

Inventors:
MATSUDA WATARU (JP)
YAMAMOTO YASUYUKI (JP)
KATAOKA YOSHIYUKI (JP)
Application Number:
PCT/JP2022/011202
Publication Date:
December 15, 2022
Filing Date:
March 14, 2022
Export Citation:
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Assignee:
RIGAKU DENKI CO LTD (JP)
International Classes:
G01N23/2209; G01N23/223
Domestic Patent References:
WO2018168939A12018-09-20
WO2015056304A12015-04-23
Foreign References:
JP2012068084A2012-04-05
JP2021051053A2021-04-01
JP2017026511A2017-02-02
JP2002082075A2002-03-22
JP2000310602A2000-11-07
JP2020165757A2020-10-08
JP2000304711A2000-11-02
JP2015031555A2015-02-16
Attorney, Agent or Firm:
SUGIMOTO, Shuji et al. (JP)
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