Title:
X-RAY FLUORESCENCE ANALYZER
Document Type and Number:
WIPO Patent Application WO/2022/013934
Kind Code:
A1
Abstract:
Provided is an X-ray fluorescence analyzer comprising an X-ray source for irradiating X-rays onto a sample, a detector for detecting X-ray fluorescence emitted from the sample as a result of the X-ray irradiation, and a sample chamber that is made of iron and is for accommodating the sample, wherein at least a portion of the inner surface of the sample chamber is covered by a layer comprising aluminum originating from molten aluminum. Also provided is an X-ray fluorescence analyzer wherein roughly the entirety of the inner surface of the sample chamber is covered by a layer comprising aluminum originating from molten aluminum.
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Inventors:
MORIHISA YUJI (JP)
Application Number:
PCT/JP2020/027312
Publication Date:
January 20, 2022
Filing Date:
July 14, 2020
Export Citation:
Assignee:
SHIMADZU CORP (JP)
International Classes:
G01N23/223
Foreign References:
| JP2016109502A | 2016-06-20 | |||
| JP2011022163A | 2011-02-03 | |||
| JPH06330346A | 1994-11-29 | |||
| JP2004043882A | 2004-02-12 | |||
| US4150179A | 1979-04-17 | |||
| JP2016114394A | 2016-06-23 | |||
| JP2011022163A | 2011-02-03 | |||
| JP2004197151A | 2004-07-15 |
Other References:
See also references of EP 4184153A4
Attorney, Agent or Firm:
FUKAMI PATENT OFFICE, P.C. (JP)
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