Title:
【発明の名称】測定値を分析するための方法及び装置
Document Type and Number:
Japanese Patent JP2002532694
Kind Code:
A
Abstract:
A method, apparatus, and article of manufacture for analyzing measurements. The invention provides a method for separating and analyzing the components of a distribution, such as deterministic and random components. The method performs the steps of collecting data from a measurement apparatus, constructing a histogram based on the data such that the histogram defines a distribution, fitting tails regions wherein deterministic and random components and associated statistical confidence levels are estimated.
Inventors:
Li Pen
Ross Adam Jessen
Jean Bryan Virus Trap
Dennis Petrich
Ross Adam Jessen
Jean Bryan Virus Trap
Dennis Petrich
Application Number:
JP2000587290A
Publication Date:
October 02, 2002
Filing Date:
December 08, 1999
Export Citation:
Assignee:
Wavecrest Corporation
International Classes:
G01D3/028; G01D21/00; G06F15/00; G06F17/18; G06F17/40; (IPC1-7): G01D21/00; G01D3/028; G06F17/18
Attorney, Agent or Firm:
Aoyama Ryo (1 person outside)