Title:
バイオメトリックデバイスに対するエラーレートを求めるための方法および装置
Document Type and Number:
Japanese Patent JP2004515014
Kind Code:
A
Abstract:
In order to determine the error rate of a biometric device, a number of foreign characteristic sets are stored in a database, which are compared during a testing process with the characteristic set of the authorized person, and personal error rates are determined for the authorized person based on this comparison.
More Like This:
Inventors:
Kurt Heschgl
Manfred Bronba
Dietmar Geselinger
Manfred Bronba
Dietmar Geselinger
Application Number:
JP2002547090A
Publication Date:
May 20, 2004
Filing Date:
November 27, 2001
Export Citation:
Assignee:
Siemens Aktiengesellschaft
International Classes:
A61B5/117; G06F21/32; G06K9/00; G06K9/62; G06T7/00; G07C9/00; G10L15/01; G10L17/10; (IPC1-7): G06T7/00; A61B5/117; G06F15/00
Attorney, Agent or Firm:
Toshio Yano
Toshiomi Yamazaki
Takuya Kuno
Einzel Felix-Reinhard
Reinhard Einsel
Toshiomi Yamazaki
Takuya Kuno
Einzel Felix-Reinhard
Reinhard Einsel