Title:
プローブの較正方法
Document Type and Number:
Japanese Patent JP2005507495
Kind Code:
A
Abstract:
A method of calibrating an analogue probe ( 10 ) having a stylus ( 12 ) with a workpiece-contacting tip ( 14 ) or a non-contact probe ( 26 ). A calibration artefact such as a calibration sphere ( 16 ) is mounted on a coordinate measuring machine (CMM) ( 18 ). The probe ( 10,26 ) is mounted on an arm ( 8 ) of the CMM and the probe is moved along a path whilst continually scanning the surface of the calibration artefact such that the probe is exercised throughout its working range. For an analogue probe ( 10 ) having a workpiece-contacting stylus ( 12 ), the path is such that the deflection of the stylus varies along the path. For a non-contact probe ( 26 ) the path is such that there is variation of the radial distance between the path and the calibration artefact. The probe path may comprise a path parallel to a chord of the calibration sphere or a curved, e.g. a sinusoidal, path.
Inventors:
Peter Hajuki Witz
Jeffrey McFarland
David Sven Wallis
Jeffrey McFarland
David Sven Wallis
Application Number:
JP2003540600A
Publication Date:
March 17, 2005
Filing Date:
November 01, 2002
Export Citation:
Assignee:
RENISHAW PUBLIC LIMITED COMPANY
International Classes:
G01B21/04; (IPC1-7): G01B21/04
Domestic Patent References:
| JP2003114112A | 2003-04-18 |
Foreign References:
| DE19809589A1 | 1999-09-09 | |||
| WO2000025087A1 | 2000-05-04 |
Attorney, Agent or Firm:
Yoshikazu Tani
Kazuo Abe
Kazuo Abe