Title:
蛍光の検出能を向上させるための光学基板
Document Type and Number:
Japanese Patent JP2006526768
Kind Code:
A
Abstract:
A sample substrate adapted for use with fluorescence excitation light with a first wavelength. A reflector is disposed on a base. The reflector includes a reflecting multilayer interference coating with at least two layers. Not all of the layers L fulfill a quarterwave condition: dL.nL=(2N+1).¼ wherein dL is a physical thickness of layer L, nL is an index of refraction of layer L at the first wavelength, N is an integer equal to or greater than zero and 1 is the first wavelength. Thicknesses of the layers ensure that any fluorescent sample material disposed on top of said multilayer interference coating would be located near an antinode of a standing wave formed by the excitation light with the first wavelength incident on said substrate.
Inventors:
Claus, Jörg
Aedlinger, Johannes
Biki, max
Tome-Forster, Heidi
Heine-Kempkens, Klaus
Meisenherder, Bernd
Caspar, Martin
Aedlinger, Johannes
Biki, max
Tome-Forster, Heidi
Heine-Kempkens, Klaus
Meisenherder, Bernd
Caspar, Martin
Application Number:
JP2006508094A
Publication Date:
November 24, 2006
Filing Date:
June 03, 2004
Export Citation:
Assignee:
Unakis Balzers Akchengezel Shaft
International Classes:
G01N21/64; G02B5/26; G02B5/28; G01N33/543
Domestic Patent References:
| JP2001242083A | 2001-09-07 | |||
| JPS6435502A | 1989-02-06 | |||
| JPH03210503A | 1991-09-13 | |||
| JPH04267202A | 1992-09-22 | |||
| JPH075311A | 1995-01-10 |
Foreign References:
| WO2002048691A1 | 2002-06-20 | |||
| US5257140A | 1993-10-26 |
Attorney, Agent or Firm:
Kuro Fukami
Toshio Morita
Yoshihei Nakamura
Yutaka Horii
Hisato Noda
Masayuki Sakai
Toshio Morita
Yoshihei Nakamura
Yutaka Horii
Hisato Noda
Masayuki Sakai
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