Title:
特にレーザ走査型顕微鏡用の調整可能なピンホール
Document Type and Number:
Japanese Patent JP2007501434
Kind Code:
A
Abstract:
An adjustable pinhole for a laser scanning microscope. The adjustable pinhole includes first and second silicon apertures movable relative to each other, each of the silicon apertures having a rectangular mirror-inverted opening, the relative movement of the openings defining a pinhole of varying size. The relative movement can be in two directions, whereby the first and second silicon apertures are displaceable with respect to one another in a first direction and whereby at least one of the silicon apertures is displaceable in a second direction perpendicular to the first direction for adjustment to obtain an exact square form for the configuration of the pinhole.
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Inventors:
Karl Heinz Bartsuke
Ralph Voleschensky
Roland scheller
Ralph Voleschensky
Roland scheller
Application Number:
JP2006529787A
Publication Date:
January 25, 2007
Filing Date:
May 12, 2004
Export Citation:
Assignee:
Carl Zeiss Jena Gezel Shaft Mitt Beschlenktel Haftung
International Classes:
G02B5/00; G02B21/00
Domestic Patent References:
| JPS63226864A | 1988-09-21 | |||
| JPH09159935A | 1997-06-20 | |||
| JP2002006117A | 2002-01-09 |
Foreign References:
| EP0565069A1 | 1993-10-13 | |||
| US3082674A | 1963-03-26 |
Attorney, Agent or Firm:
Sho Matsuda