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Title:
信号アーチファクトを推定するためのシステム及び方法
Document Type and Number:
Japanese Patent JP2007508616
Kind Code:
A
Abstract:
A method and system are disclosed that detect signal artifacts in one or more event signals. The system and method may be used to estimate whether a monitored signal includes artifacts based upon a statistical analysis using a transform function.

Inventors:
Ali Walid
Application Number:
JP2006530980A
Publication Date:
April 05, 2007
Filing Date:
October 06, 2004
Export Citation:
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Assignee:
Koninklijke Philips Electronics N.V.
International Classes:
G06Q50/00; A61B5/0245; A61B5/0452; G06K9/00; G16H40/67
Domestic Patent References:
JP2000350709A2000-12-19
JPH11514901A1999-12-21
JPH11137530A1999-05-25
JPH1085197A1998-04-07
JP2003260035A2003-09-16
JP2003116801A2003-04-22
JP2004501380A2004-01-15
JP2003135454A2003-05-13
JP2000350729A2000-12-19
JP2001120533A2001-05-08
JPH02226073A1990-09-07
JP2005503851A2005-02-10
JP2005524049A2005-08-11
Foreign References:
WO2003021517A22003-03-13
WO2003019184A12003-03-06
WO2002000112A22002-01-03
WO2003071391A22003-08-28
WO2002099568A22002-12-12
Attorney, Agent or Firm:
Susumu Tsugaru
Akihiko Miyazaki
Fueda Shusen