Title:
クロマトグラフィー/マススペクトロメトリーを用いてサンプルを分析する手段と方法
Document Type and Number:
Japanese Patent JP2009503480
Kind Code:
A
Abstract:
A method for analyzing a test sample is disclosed, the test sample comprising at least one compound. A test sample comprising at least one compound is provided. Next, the at least one compound in the test sample is determined, thereby generating raw results. The generated raw results are analyzed, wherein the analysis of the test sample is accompanied by an analysis of at least one reference sample. The test sample and the reference sample are analyzed in an identical sequence in each step of the method. A system for carrying out the method is also disclosed.
More Like This:
Inventors:
Valk, Tillman Bee.
Loser, Ralph
Betan, Bianca
Herold, Michael Manfred
Kamage, Beate
Oliver Schmitz
Ravenz Way, Benald Van
Melert, werner
Coelho Palermo Kunha, Georgia
Ehrhardt, Thomas
Wiemer, Jancy
Prokoudine, Alexandre
Klenrich, Gerhard
Loser, Ralph
Betan, Bianca
Herold, Michael Manfred
Kamage, Beate
Oliver Schmitz
Ravenz Way, Benald Van
Melert, werner
Coelho Palermo Kunha, Georgia
Ehrhardt, Thomas
Wiemer, Jancy
Prokoudine, Alexandre
Klenrich, Gerhard
Application Number:
JP2008523350A
Publication Date:
January 29, 2009
Filing Date:
July 25, 2006
Export Citation:
Assignee:
Metanomics Game Behr
International Classes:
G01N30/86; G01N27/62; G01N30/72
Domestic Patent References:
| JPH0792152A | 1995-04-07 | |||
| JPH04130271A | 1992-05-01 | |||
| JP2002340904A | 2002-11-27 |
Foreign References:
| WO2003092869A1 | 2003-11-13 | |||
| WO2004106915A1 | 2004-12-09 | |||
| WO2004090526A1 | 2004-10-21 |
Attorney, Agent or Firm:
Yusuke Hiraki
Ishii Teiji
Satoshi Fujita
Natsuo Tanaka
Ishii Teiji
Satoshi Fujita
Natsuo Tanaka