高反射物質あるいは透過性物質の三次元光学測定装置および方法

Japanese Patent JP2012512400

A

The invention relates to a device for three-dimensionally measuring an object, comprising a first projection device having a first infrared light source for projecting a displaceable first pattern onto the object, and at least one image capturing device for capturing images of the object in an infrared spectral range. The invention further relates to a method for three-dimensionally measuring an object, comprising the steps of projecting a first infrared pattern onto the object using a first projection device having a first infrared light source; and capturing images of the object using at least one image capturing device sensitive to infrared radiation, wherein the pattern is shifted between image captures.

WO/2020/232739	A CHROMATIC CONFOCAL SYSTEM AND A METHOD FOR INSPECTING AN OBJECT
JP6267486	Image processing device, image processing method
JP2014228402	THREE-DIMENSIONAL MEASURING APPARATUS

David Nabs
Kai Gensec

JP2011541117A

May 31, 2012

May 07, 2009

Click for automatic bibliography generation  

AIMESS SERVICES GMBH

G01B11/25

JPH1194520A	1999-04-09
JPH11257930A	1999-09-24
JP2003232620A	2003-08-22
JPH04212003A	1992-08-03
JPH05231832A	1993-09-07
JPH10253325A	1998-09-25
JP2003270036A	2003-09-25
JP2008500524A	2008-01-10
JP2006170744A	2006-06-29
JP2008500524A	2008-01-10
JP2006300949A	2006-11-02
JP2005308439A	2005-11-04
JPH05180632A	1993-07-23
JPH04212003A	1992-08-03
JPH05231832A	1993-09-07
JPH10253325A	1998-09-25
JPH1194520A	1999-04-09
JPH11257930A	1999-09-24
JP2003232620A	2003-08-22
JP2003270036A	2003-09-25

US4511252A	1985-04-16
US5719395A	1998-02-17
US20030137673A1	2003-07-24
US20080279446A1	2008-11-13
US5376793A	1994-12-27
DE10006663A1	2001-08-23
EP1391176A1	2004-02-25
US4511252A	1985-04-16
US5719395A	1998-02-17
US20030137673A1	2003-07-24
US20080279446A1	2008-11-13

Kiyoshi Mizuno
Hitoshi Kitamura
Tatsuo Itami

Previous Patent: ナビゲーションシステムにおけるオブジェクトへのイメージの動的マッピ�...

Next Patent: たばこの製造及び／又は包装の最に検査すべき対象の検査を行う方法およ�...