Title:
OPHTHALMOLOGIC EXAMINATION SUPPORT SYSTEM AND OPHTHALMOLOGIC EXAMINATION SUPPORT SERVER
Document Type and Number:
Japanese Patent JP2019084366
Kind Code:
A
Abstract:
To provide a wide spectrum of early detection methods and preventive medical care for ophthalmologic diseases.SOLUTION: A server of an ophthalmologic examination support system according to the embodiment includes: a medical information storage device for storing medical information of each patient; and a management device for managing the medical information. The medical information includes images of the patient's eyes. Associated information associates feature information indicating functional features of an eye of a given patient with the examination conditions of an ophthalmologic examination on the patient. An examination condition acquisition unit analyzes an image retrieved based on the patient information transmitted from a client to determine whether or not the image includes the functional features included in the associated information. The examination condition acquisition unit further acquires, from the associated information, the examination conditions corresponding to the feature information indicating the functional features determined to be included in the image. The client performs control based on the acquired examination conditions.SELECTED DRAWING: Figure 2
Inventors:
TSUKADA HIROSHI
Application Number:
JP2019009968A
Publication Date:
June 06, 2019
Filing Date:
January 24, 2019
Export Citation:
Assignee:
TOPCON CORP
International Classes:
A61B3/00; G16H30/40
Domestic Patent References:
| JP2015033471A | 2015-02-19 | |||
| JP2009165710A | 2009-07-30 | |||
| JP2004154560A | 2004-06-03 | |||
| JP2009011829A | 2009-01-22 |
Foreign References:
| US20110299034A1 | 2011-12-08 |
Attorney, Agent or Firm:
Enami Tomokazu