Title:
PROBE DEVICE, ELECTRICITY INSPECTION DEVICE, AND METHOD FOR INSPECTING ELECTRICITY
Document Type and Number:
Japanese Patent JP2020085695
Kind Code:
A
Abstract:
To provide a probe device, an electricity inspection device, and a method for inspecting electricity which can run an accurate inspection of the electricity of a printed circuit board at low cost.SOLUTION: The present invention relates to a probe device used for an electric inspection of a printed circuit board, and the probe device includes at least one probe group having a plurality of wire probes electrically connected to each other in wiring extending in a predetermined direction on the printed circuit board. The wire probes can contact with each other in the predetermined direction.SELECTED DRAWING: Figure 1A
Inventors:
TAKANO SHOJI
MATSUDA FUMIHIKO
NARUSAWA YOSHIHIKO
MATSUDA FUMIHIKO
NARUSAWA YOSHIHIKO
Application Number:
JP2018221620A
Publication Date:
June 04, 2020
Filing Date:
November 27, 2018
Export Citation:
Assignee:
NIPPON MEKTRON KK
International Classes:
G01R1/067; G01R1/073
Domestic Patent References:
| JP2008187024A | 2008-08-14 | |||
| JP2015118064A | 2015-06-25 | |||
| JP2006138787A | 2006-06-01 | |||
| JP2010197092A | 2010-09-09 | |||
| JP2009139104A | 2009-06-25 | |||
| JP2016011925A | 2016-01-21 | |||
| JP2016085068A | 2016-05-19 | |||
| JPH10339740A | 1998-12-22 | |||
| JP2015102378A | 2015-06-04 |
Foreign References:
| WO2013051675A1 | 2013-04-11 | |||
| US20060103399A1 | 2006-05-18 |
Attorney, Agent or Firm:
Hiroyuki Nagai
Yukitaka Nakamura
Yasukazu Sato
Satoru Asakura
Masashi Yoshida
Yukitaka Nakamura
Yasukazu Sato
Satoru Asakura
Masashi Yoshida