Title:
X-RAY INSPECTION DEVICE
Document Type and Number:
Japanese Patent JP2021076549
Kind Code:
A
Abstract:
To provide an X-ray inspection device which can properly correct an error in the weight inspection that changes over time.SOLUTION: An X-ray inspection device 100 comprises: a conveyance unit 120 which conveys an inspection object SG; an imaging unit which images an X-ray transmission image of the inspection object SG conveyed by the conveyance unit 120; a weight estimation unit which calculates the pre-correction weight of the inspection object SG on the basis of the X-ray transmission image captured by the imaging unit and calculates the post-correction weight by multiplying the pre-correction weight by a correction coefficient; and a correction coefficient updating unit which calculates the correction coefficient on the basis of the pre-correction weight calculated by the weight estimation unit and the reference weight of the inspection object SG and updates the existing correction coefficient with the calculated correction coefficient for the inspection object SG whose X-ray transmission image is imaged at a prescribed timing.SELECTED DRAWING: Figure 2
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Inventors:
YAMASHIRO NAOYA
Application Number:
JP2019205481A
Publication Date:
May 20, 2021
Filing Date:
November 13, 2019
Export Citation:
Assignee:
SYSTEM SQUARE INC
International Classes:
G01N23/18; G01N23/04
Attorney, Agent or Firm:
Shigeki Orizaka