Title:
DEFECT DETECTION METHOD
Document Type and Number:
Japanese Patent JP2021081189
Kind Code:
A
Abstract:
To provide a defect detection method capable of both highly accurate determination of a contact state between an ultrasonic probe and an inspection target and detection of defects using the ultrasonic probe having a simple structure.SOLUTION: A defect detection method includes: a preparation step of preparing an ultrasonic probe (1) by including a transmitting oscillator (10), a receiving oscillator (20), an absorber (30) having a sound velocity lower than that of an inspection target (T), and a wedge (40); a determination step of determining whether or not the wedge (40) and the inspection target (T) are in contact with each other by comparing a reference signal in the non-contact state when ultrasonic waves are received by the receiving oscillator (20) via a lower surface of the absorber (30) with surface noise when ultrasonic waves are received by the receiving oscillator (20) via the boundary between the lower surface of the absorber (30) and the inspection target (T); and a detection step of detecting defects existing in the inspection target (T) based on a flaw detection signal.SELECTED DRAWING: Figure 1
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Inventors:
NOMURA KODAI
WASA YASUHIRO
FUKUI TOSHIHIDE
WASA YASUHIRO
FUKUI TOSHIHIDE
Application Number:
JP2018016159A
Publication Date:
May 27, 2021
Filing Date:
February 01, 2018
Export Citation:
Assignee:
KOBE STEEL LTD
International Classes:
G01N29/07
Attorney, Agent or Firm:
Etsushi Kotani
Masataka Otani
Hideaki Arata
Masataka Otani
Hideaki Arata