Title:
FILTER INSPECTION SYSTEM AND FILTER INSPECTION METHOD IN PARTICULATE ANALYZER
Document Type and Number:
Japanese Patent JP2021085839
Kind Code:
A
Abstract:
To realize appropriate filter replacement.SOLUTION: A control device 200 executes a filter inspection mode in which a continuity state in a primary filter 121 and a secondary filter 122 is inspected and a non-filter inspection mode which is other than the filter inspection mode, raises the flow rate of a gas for filter inspection that is introduced from a gas introduction device 101 for filter inspection in the filter inspection mode to be larger than when the non-filter inspection mode is carried out so that the flow rate of the gas for filter inspection is larger than or equal to the flow rate flowing from the primary filter 121 toward a gas analyzer 130, and outputs an alarm from an alarm device 201 for prompting the replacement of at least the secondary filter 122 when the first pressure value measured by a pressure sensor 131 is lower than a first threshold stored in a storage device 202.SELECTED DRAWING: Figure 1
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Inventors:
KUMANO SHUN
MIZUNO HIROKI
NAGANO HISASHI
NOJIRI TATSUO
MIZUNO HIROKI
NAGANO HISASHI
NOJIRI TATSUO
Application Number:
JP2019216961A
Publication Date:
June 03, 2021
Filing Date:
November 29, 2019
Export Citation:
Assignee:
HITACHI LTD
International Classes:
G01N15/08; G01N1/02; G01N27/62
Domestic Patent References:
| JP2019178942A | 2019-10-17 | |||
| JPH09313852A | 1997-12-09 | |||
| JP2011027307A | 2011-02-10 | |||
| JP2014174074A | 2014-09-22 |
Foreign References:
| WO2019151383A1 | 2019-08-08 | |||
| US6327893B1 | 2001-12-11 |
Attorney, Agent or Firm:
Isono International Patent and Trademark Office