Title:
MEASUREMENT DEVICE AND MEASUREMENT METHOD
Document Type and Number:
Japanese Patent JP2021104160
Kind Code:
A
Abstract:
To extract necessary measurement data without affecting the analysis technique even under an environment that has large measurement errors and reflection noise.SOLUTION: A measurement device includes a processor and a storage unit. The storage unit holds measurement data for each time acquired by an imaging device and space-time restriction. The processor extracts a position of an object from the measurement data for each time, determines whether the object satisfies the time-space restriction, and determines whether the object is an analysis object based on a result of the determination on whether the object satisfies the time-space restriction.SELECTED DRAWING: Figure 2
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Inventors:
NAKAGAWA HIROMITSU
TANAKA TAKESHI
FUKUI DAISUKE
TANAKA TAKESHI
FUKUI DAISUKE
Application Number:
JP2019236325A
Publication Date:
July 26, 2021
Filing Date:
December 26, 2019
Export Citation:
Assignee:
HITACHI HIGH TECH CORP
International Classes:
A61B5/117; A61B5/11; G01B11/00; G06T7/00
Domestic Patent References:
| JP2019121904A | 2019-07-22 | |||
| JP2005276010A | 2005-10-06 |
Foreign References:
| WO2017130902A1 | 2017-08-03 |
Attorney, Agent or Firm:
Fujio Patent Office