Title:
DIAGNOSTIC DEVICE, DIAGNOSTIC METHOD, AND PROGRAM
Document Type and Number:
Japanese Patent JP2021145482
Kind Code:
A
Abstract:
To make it possible to determine normality/abnormality of a construction state of wiring to improve construction quality in a photovoltaic power generation system.SOLUTION: A diagnostic device comprises a control unit for executing: a step S101 of acquiring a current voltage characteristic of a solar cell; a step S103 in which on the basis of a first characteristic value of one of a voltage value and a current value for each of sample points at which the current voltage characteristic is measured and a second characteristic value of the other, a first characteristic value and a second characteristic value of a sample point at which a short circuit current value, an open voltage value, and a power value are maximized are identified; a step S105 of calculating a degree of change in a gradient of a second characteristic value due to increase or decrease in a first characteristic value in the vicinity of a sample point at which the power value is maximized in the current voltage characteristic normalized on the basis of the short circuit current value and the open voltage value; and a step S106 of performing a diagnosis on whether a power generation state of the solar cell is a normal state or an abnormal state on the basis of the calculated degree of change in the gradient of the second characteristic value due to increase or decrease in the first characteristic value in the vicinity of the sample point.SELECTED DRAWING: Figure 8
Inventors:
IWAMI TARO
OTANI MASARU
YOSHIDA YOKO
OTANI MASARU
YOSHIDA YOKO
Application Number:
JP2020043066A
Publication Date:
September 24, 2021
Filing Date:
March 12, 2020
Export Citation:
Assignee:
OMRON TATEISI ELECTRONICS CO
International Classes:
H02S50/00; G05F1/67; H02J3/38
Attorney, Agent or Firm:
Hidewa Patent Office