Title:
MEASURING DEVICE AND PROBE SET FOR THE SAME
Document Type and Number:
Japanese Patent JP2022186584
Kind Code:
A
Abstract:
To increase the elasticity of a probe set and improve the stability of a structure.SOLUTION: The present invention discloses a measuring device and a probe set for the same. The measuring device comprises: a circuit board; a plurality of probe sets that are arranged independently of each other at a certain interval; a first case; and a second case. Each of the plurality of probe sets has: a main body that has a plurality of strip through holes opened therein and includes a first side face and a second side face facing each other; a first contact stage that is connected to the first side face; and a second contact stage that is connected to the second side face. An extension direction of the first contact stage with respect to the main body and an extension direction of the second contact stage with respect to the main body are different from each other. A first end of the first contact stage is in contact with an object to be measured, and a second end of the second contact stage is in contact with the circuit board.SELECTED DRAWING: Figure 3
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Inventors:
LOU CHOON LEONG
Application Number:
JP2022011680A
Publication Date:
December 15, 2022
Filing Date:
January 28, 2022
Export Citation:
Assignee:
TECAT TECH SUZHOU LTD
International Classes:
G01R1/067
Domestic Patent References:
| JP2014001924A | 2014-01-09 | |||
| JP2009115585A | 2009-05-28 | |||
| JP2006337229A | 2006-12-14 | |||
| JP2006300807A | 2006-11-02 | |||
| JP2013171005A | 2013-09-02 | |||
| JP2006234428A | 2006-09-07 |
Attorney, Agent or Firm:
Shigeru Kinoshita