Title:
【発明の名称】微分利得及び微分位相の測定装置
Document Type and Number:
Japanese Patent JP2942964
Kind Code:
B2
More Like This:
| JPS61284674 | TESTING METHOD FOR SEMICONDUCTOR DEVICE |
Inventors:
MACHIDA AKIHARU
Application Number:
JP18656690A
Publication Date:
August 30, 1999
Filing Date:
July 13, 1990
Export Citation:
Assignee:
YOKOKAWA DENKI KK
International Classes:
G01R27/28; G01R31/00; H03M1/10; H04N17/02; (IPC1-7): H03M1/10; G01R31/00; H04N17/02
Domestic Patent References:
| JP61193516A | ||||
| JP1160217A | ||||
| JP1126728U |
Attorney, Agent or Firm:
Hirofumi Higashino