Title:
【発明の名称】ストレス計測装置
Document Type and Number:
Japanese Patent JP3054708
Kind Code:
B1
Abstract:
PROBLEM TO BE SOLVED: To attain a high-precision estimated stress value in a stress measuring device. SOLUTION: This stress measuring device is provided with a stress load system 1, measuring units 2-4 measuring multiple physiological quantities of a human body, and a stress measuring circuit 5. The stress measuring circuit 5 is provided with index value derivation sections 7-9 deriving multiple index values from multiple physiological quantities, a single regression equation calculation section 10 applying a regression analysis to the index values with explanatory variables and the subjective declared values of stresses used as objective variables, a memory 13 storing grouped results of multiple testees based on multiple correlation coefficients obtained on multiple indexes, a memory 14 storing stress estimating equations for sorted groups, an attribute group calculation section 12 judging the group to which a measurement subject belongs based on multiple correlation coefficients on multiple indexes obtained by the single regression equation calculation section 10, and a stress calculation section 15 substituting multiple index values on the measurement subject into the stress estimating equation on the judged group.
Inventors:
Hirokazu Genno
Keiko Ishikawa
Osamu Kanbara
Keiko Ishikawa
Osamu Kanbara
Application Number:
JP8661199A
Publication Date:
June 19, 2000
Filing Date:
February 23, 1999
Export Citation:
Assignee:
Director of Industrial Technology
International Classes:
A61B5/01; A61B5/00; A61B5/16; A61B10/00; (IPC1-7): A61B5/00; A61B10/00
Domestic Patent References:
| JP928678A | ||||
| JP8252226A | ||||
| JP928679A | ||||
| JP4338460A |