Title:
【発明の名称】信号測定用装置
Document Type and Number:
Japanese Patent JP3098374
Kind Code:
B2
Abstract:
PURPOSE:To match the characteristic impedance of a measuring circuit system while suppressing fluctuation in the referential voltage of a measuring probe. CONSTITUTION:An electronic circuit package 9 to be measured is covered, on the surface thereof, with a reference potential plate 5. The reference potential plate 5 is caulked with a guide sleeve 4 for securing a measuring probe 13 thus stabilizing electrical and mechanical connection between the measuring probe 13 and the reference potential plate 5. The reference potential plate 5 is arranged, substantially on the entire surface thereof, with guide sleeves 4 corresponding to the measuring pads of the electronic circuit package 9.
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Inventors:
Koji Tayama
Akira Tsukada
Tetsuro Mikazuki
Kazuhiko Sakakibara
Hironori Oka
Akira Tsukada
Tetsuro Mikazuki
Kazuhiko Sakakibara
Hironori Oka
Application Number:
JP4821294A
Publication Date:
October 16, 2000
Filing Date:
March 18, 1994
Export Citation:
Assignee:
NEC
Nippon Telegraph and Telephone Corporation
Nippon Telegraph and Telephone Corporation
International Classes:
G01R1/073; G01R1/06; G01R31/02; G01R31/28; (IPC1-7): G01R31/28; G01R1/06; G01R31/02
Domestic Patent References:
| JP560789A | ||||
| JP5256905A | ||||
| JP63317784A | ||||
| JP4134075U |
Attorney, Agent or Firm:
Nobuyuki Kaneda (2 others)