Title:
半導体メモリ装置のカラムリペア回路及びカラムリペア方法
Document Type and Number:
Japanese Patent JP3978591
Kind Code:
B2
Abstract:
Circuits and methods for repairing a column in repairing a row by using an adjacent block are disclosed. An adjacent block selecting fuse unit generates an adjacent block selecting signal in response to a column redundancy start signal. The adjacent block selecting signal determines whether to use either row repair lines of a block designated by an externally inputted block address or row repair lines of an adjacent block of the block. A fuse unit receives the column redundancy start signal, the adjacent block designating bit, the inverted adjacent block designating bit and a plurality block address bits in which the adjacent block designated bit and the inverted adjacent block designating bit are removed from the block address and the inverting block address, and outputs an output signal.
Inventors:
Sword
Application Number:
JP2002130722A
Publication Date:
September 19, 2007
Filing Date:
May 02, 2002
Export Citation:
Assignee:
HYNIX SEMICONDUCTOR INC.
International Classes:
G11C29/04; G11C29/00
Attorney, Agent or Firm:
Eiji Saegusa
Kakehi Yuro
Takeshi Ohara
Hiroji Nakagawa
Yasumitsu Tate
Kenji Saito
Jun Fujii
Hitoshi Seki
Mutsuko Nakano
Shinichi Mashita
Ryuji Inuchi
Kakehi Yuro
Takeshi Ohara
Hiroji Nakagawa
Yasumitsu Tate
Kenji Saito
Jun Fujii
Hitoshi Seki
Mutsuko Nakano
Shinichi Mashita
Ryuji Inuchi