Title:
全反射減衰を利用した測定装置及びその測定方法
Document Type and Number:
Japanese Patent JP4086851
Kind Code:
B2
Inventors:
Muraishi Katsuaki
Application Number:
JP2005039501A
Publication Date:
May 14, 2008
Filing Date:
February 16, 2005
Export Citation:
Assignee:
FUJIFILM Corporation
International Classes:
G01N21/27; G01N21/01; G01N21/05; G01N21/11; G01N21/75; G01N35/00; G01N35/10; G01N33/543
Domestic Patent References:
| JP2001330560A | ||||
| JP6273328A | ||||
| JP55734A | ||||
| JP2003114238A | ||||
| JP2000121646A | ||||
| JP2002372490A | ||||
| JP2003254905A | ||||
| JP3468091B2 | ||||
| JP2002333450A | ||||
| JP200398074A | ||||
| JP200690899A | ||||
| JP200690718A |
Foreign References:
| US5443791 |
Attorney, Agent or Firm:
Kazunori Kobayashi
Shigeru Iijima
Kobayashi Hideyoshi
Shigeru Iijima
Kobayashi Hideyoshi