Title:
前眼部断面解析装置及び前眼部断面解析プログラム
Document Type and Number:
Japanese Patent JP4104302
Kind Code:
B2
Abstract:
The present invention intends to provide an apparatus for analyzing a sectional image of an anterior eye segment and a program for the same which reduce a burden on an examiner, and to provide a more reliable, reproducible result. The apparatus for analyzing a sectional image of an anterior eye segment which is light-sectioned by slit light and photographed comprises a defining device for defining a target opacity part in the sectional image based on a density distribution being between a cornea and a fundus and being in a first direction perpendicular to an optical axis of an eye to be examined, a determining device for determining an area to be analyzed based on the defined opacity part, and an analyzing device for analyzing an opacity condition base on the density distribution in the determined area.
Inventors:
Torii Miwako
Setsuo Saito
Setsuo Saito
Application Number:
JP2001211359A
Publication Date:
June 18, 2008
Filing Date:
July 11, 2001
Export Citation:
Assignee:
NIDEK CORPORATION
International Classes:
A61B3/14; A61B3/117; G06T1/00; G06T7/00; A61B3/135; A61F9/00
Domestic Patent References:
| JP1204643A | ||||
| JP9149887A | ||||
| JP2000197607A | ||||
| JP10033482A |