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Title:
元素の質量分析のための装置および方法
Document Type and Number:
Japanese Patent JP4164027
Kind Code:
B2
Abstract:
A mass spectrometer and method of mass spectrometry in which polyatomic and doubly charged ion interferences are attenuated by establishing an electron population through which a beam of particles containing elemental sample ions and the interfering ions is passed such that the interfering ions preferentially undergo ion-electron recombination and thus dissociation to remove a significant number of the interfering ions. Means ( 30 or 32 ) for providing a population of electrons ( 34 or 36 ) in an ICP-MS ( 22 ) may comprise a magnetic field means such as an electric coil, or an electron generating device. The population of electrons has an electron number density (>1011 cm-3 to 1014 cm-3), a free electron energy (>0.01 eV to <5 eV) in a region at a low pressure (<10 Torr), such that for a predetermined path length (1-4 cm) of the ions through the electron population, the interfering ions will preferentially be attenuated by the dissociative recombination process. The ion beam ( 40 ) then passes to a mass analyser ( 42 ) and ions which have been separated according to their mass-to-charge ratio are detected by ion detector ( 44 ).

Inventors:
KALINITCHENKO IOURI (AU)
Application Number:
JP2003527764A
Publication Date:
October 08, 2008
Filing Date:
September 10, 2002
Export Citation:
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Assignee:
VARIAN AUSTRALIA (AU)
International Classes:
G01N27/62; H01J49/06; H01J49/10; H01J49/26
Domestic Patent References:
JP1311554A
JP2000067804A
JP11025903A
JP10142155A
JP10021870A
JP2001311720A
Attorney, Agent or Firm:
Inaoka cultivation
Mio Kawasaki