Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
光学結晶内局所構造判定方法
Document Type and Number:
Japanese Patent JP4260555
Kind Code:
B2
Abstract:
Method for detecting local structures in optical materials, especially crystals, whereby in a first step schlieren and optical inhomogeneities are detected using divergent white light, while in a second step polarized laser light is used with stress birefringence to detect local defects and structural defects with spatial resolution of at least 0.5 mm and in a third step an interferometric examination of the material is executed.

Inventors:
Ewald Mersen
Accel Engel
Christian Remke
Gunter Gravosch
Application Number:
JP2003174243A
Publication Date:
April 30, 2009
Filing Date:
June 19, 2003
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
Schott AG
International Classes:
G01B11/30; G01N21/958; G01M11/00; G01N21/23; G01N21/45; G01N21/896; G03F7/20
Domestic Patent References:
JP5302936A
JP2002504673A
JP11513481A
JP3653591B2
JP11201895A
JP9229870A
JP6288930A
JP10267831A
JP59180650U
JP62073140A
JP2000009654A
JP2158383A
Other References:
V.S.Doladugina,Effect of rounding and drilling on the optical characteristics of fluorite items,Journal of Optical Technology,2001年 7月,Vol.68 No.7,pp.471-475
Attorney, Agent or Firm:
Tadashi Hamamoto