Title:
アレイ基板の検査方法及び検査装置
Document Type and Number:
Japanese Patent JP4587678
Kind Code:
B2
Abstract:
A method and a device for testing an array substrate for a liquid crystal display that allow time for testing to be reduced are provided. An array substrate is divided into two test blocks, and two scanning signal lines in total, one from each of the test blocks, are selected and tested at a time, so that the addresses of possible defective pixels are specified. Then, the array substrate is divided into three test blocks, and three scanning signal lines in total, one from each of the test blocks, are selected and re-tested at a time, so that the addresses of possible defective pixels are specified. Then, the address of a pixel common between the first testing and re-testing is specified as a defective address.
Inventors:
Tomoyuki Taguchi
Eye piece Yoshinori
Shunichi Komatsu
Hiroki Nishiyama
Iwami Tsukasa
Eye piece Yoshinori
Shunichi Komatsu
Hiroki Nishiyama
Iwami Tsukasa
Application Number:
JP2004054863A
Publication Date:
November 24, 2010
Filing Date:
February 27, 2004
Export Citation:
Assignee:
INTERNATIONAL BUSINESS MASCHINES CORPORATION
International Classes:
G01R31/00; G01M11/00; G02F1/13; G01R31/28; G02F1/1368; G09F9/00
Domestic Patent References:
| JP10177357A |
Attorney, Agent or Firm:
Hidetoshi Ueba
Hiroshi Sakaguchi
Yoshihiro City
Takeshi Ueno
Hiroshi Sakaguchi
Yoshihiro City
Takeshi Ueno