Login| Sign Up| Help| Contact|

Patent Searching and Data


Title:
測定誤差の補正方法
Document Type and Number:
Japanese Patent JP4670549
Kind Code:
B2
More Like This:
WO/1997/026544METHOD AND DEVICE FOR MEASURING THE RETURN LOSS OF A RADIOFREQUENT SIGNAL
JPH0777544MEASURING APPARATUS FOR VECTOR OF ULTRAHIGH FREQUENCY SIGNAL
JP2003532307[Title of Invention] S-parameter microscopic analysis for semiconductor devices
Inventors:
Hiroshi Tomohiro
Kamiyadake
Application Number:
JP2005243934A
Publication Date:
April 13, 2011
Filing Date:
August 25, 2005
Export Citation:
Click for automatic bibliography generation   Help
Assignee:
MURATA MANUFACTURING CO.,LTD.
International Classes:
G01R27/28; G01R35/00
Domestic Patent References:
JP2003294820A
JP2000162257A
Foreign References:
WO2005116669A1
Attorney, Agent or Firm:
Toshinori Yamamoto



 
Previous Patent: 防犯ブザー付クレセント錠

Next Patent: 表示制御装置及びプログラム