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Title:
トップエントリ式試料ステージ傾斜装置
Document Type and Number:
Japanese Patent JP4679279
Kind Code:
B2
Abstract:

To adjust a sample at a high gradient angle the sample cooled to very low temperature.

This top entry type sample stage tilting device T is provided with a cooling dome 19 having a stage mounting hole 19b coaxial with an optical axis of a charged particle beam and a liquid helium filling pod 19a provided in an upper outer peripheral part, a sample stage ST provided with a stage rotary shaft 53 rotatably supported in a lower part of the stage mounting hole 19b and a holder mounting member HS detachably attached with a specimen holder H rotating with rotation of the stage rotary shaft 53, a holder tilting shaft 35 connected with the stage rotary shaft 53, a rotary member KS for tilting the stage rotating the holder tilting shaft 35 around its shaft, the low-temperature shield 26 wherein a rotary shaft passage groove 26a is formed in a position the stage rotary shaft 53 passes and a movable shield 27 covering the outside of the rotary shaft passage groove 26a.

COPYRIGHT: (C)2007,JPO&INPIT


Inventors:
Yoshinori Fujiyoshi
Shunji Deguchi
Application Number:
JP2005205558A
Publication Date:
April 27, 2011
Filing Date:
July 14, 2005
Export Citation:
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Assignee:
JEOL Ltd.
International Classes:
H01J37/20
Domestic Patent References:
JP54004563A
JP2000505944A
JP2004333405A
JP63018760U
JP2005044700A
JP3254116A
JP10147865A
JP11287813A
JP2002134053A
JP9306405A
JP6076777A
Attorney, Agent or Firm:
Kamei Takeyuki



 
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