半導体装置 - Fujitsu Semiconductor Limited

Title:

半導体装置

Document Type and Number:

Japanese Patent JP4693870

Kind Code:

B2

Abstract:

To suppress power consumption by leak current of a block in which the power source is intermittently turned on/off in a semiconductor.

This semiconductor device 1 is provided with an error check necessity determining means 4, and is configured to determine the necessity of error check on the basis of notification from an error check necessity notifying means 6 provided in a block 2 where the power is not disconnected, and to perform error check of data loaded from an external memory means when an error check executing means 5 is booted according to the determination. Since all of the error check can not be eliminated, one-time forced execution is performed in each of the number booting times set by an error check interval setting means 7 to secure the reliability of the system. Consequently, a period when the semiconductor device intermittently operates can be shortened by only an error check time so that useless leak current consumption can be suppressed.

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Inventors:

Koichi Kuroiwa
Shoji Taniguchi
Masami Kanasugi

Application Number:

JP2008149133A

Publication Date:

June 01, 2011

Filing Date:

June 06, 2008

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