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Title:
光電変換素子並びに半導体装置
Document Type and Number:
Japanese Patent JP4739274
Kind Code:
B2
Abstract:

To provide a photoelectric conversion element with an end side face of different taper angle through gradual photoelectric conversion layer etching.

A pin-type photoelectric conversion element is faster in responsiveness than a pn-type photoelectric conversion element but it has a great drawback of dark current. A cause for this dark current is that an etching residue stacks at the end side face of a photoelectric conversion layer as a result of etching and electric conduction occurs via the etching residue. To cope with this problem, the end side face is taper shaped with two stages unlike a conventional single face taper shape and the end side faces of p and n layers in the photoelectric conversion layer are not placed on the same surface, resulting in leak current reduction in the photoelectric conversion element.

COPYRIGHT: (C)2008,JPO&INPIT


Inventors:
Shinya Sasakawa
Shinya Hasegawa
Hidekazu Takahashi
Tatsuya Arao
Application Number:
JP2007117904A
Publication Date:
August 03, 2011
Filing Date:
April 27, 2007
Export Citation:
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Assignee:
Semiconductor Energy Laboratory Co., Ltd.
International Classes:
H01L31/10; H01L21/3065; H01L27/14; H01L27/146
Domestic Patent References:
JP21184A
JP60268077A
Attorney, Agent or Firm:
Kenzo Fukuda
Shinichi Fukuda
Kyosuke Kato



 
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