Title:
故障診断装置及び故障診断方法
Document Type and Number:
Japanese Patent JP4842876
Kind Code:
B2
Abstract:
There is provided a failure diagnostic apparatus that diagnoses a semiconductor integrated circuit device for failure based on a compressed signal obtained by compressing a plurality of signals outputted from a plurality of scan chains in which a plurality of scan flip-flops, to which signals from the semiconductor integrated circuit device are inputted, are connected in series. For each stage of the scan chains, the failure diagnostic apparatus sets a virtual space compression circuit that compresses output signals of the scan flip-flops in the stage and a virtual pin connected to the output terminal of the virtual space compression circuit, and the output signal of the virtual pin is compared with the compression signal to diagnose the semiconductor integrated circuit device for failure.
Inventors:
Takayuki Kato
Application Number:
JP2007093853A
Publication Date:
December 21, 2011
Filing Date:
March 30, 2007
Export Citation:
Assignee:
Fujitsu Semiconductor Limited
International Classes:
G01R31/28; G06F11/22
Domestic Patent References:
| JP2000266815A | ||||
| JP2004012374A |
Attorney, Agent or Firm:
Hironobu Onda
Makoto Onda
Makoto Onda