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Title:
自己修正可能な半導体、およびその方法
Document Type and Number:
Japanese Patent JP4963782
Kind Code:
B2
Abstract:
A self-reparable semiconductor includes multiple functional units that perform the same function and that include sub-functional units. The semiconductor includes one or more full or partial spare functional units that are integrated into the semiconductor. If a defect in a sub-functional unit is detected, then that sub-functional unit is switched out and replaced with a sub-functional unit in the full or partial spare functional unit. The reconfiguration is realized with switching devices that are associated with the sub-functional units. Defective functional or sub-functional units can be detected after assembly, during power up, periodically during operation, and/or manually.

Inventors:
Starja Sahat
Starja Pantus
Willam Lo
Application Number:
JP2004264756A
Publication Date:
June 27, 2012
Filing Date:
September 10, 2004
Export Citation:
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Assignee:
Marvel World Trade Limited
International Classes:
G06F11/20; H01L21/82; H01L21/00; H01L21/822; H01L21/66; H01L27/00; H01L27/04; H03K19/177
Domestic Patent References:
JP2001527218A
Foreign References:
US6091258
Attorney, Agent or Firm:
Akihiro Ryuka



 
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