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Patent Searching and Data


Title:
欠陥検査装置及び欠陥検査方法
Document Type and Number:
Japanese Patent JP5002961
Kind Code:
B2
Inventors:
Okuyama Shinji
Hiroshi Kondo
Application Number:
JP2006004073A
Publication Date:
August 15, 2012
Filing Date:
January 11, 2006
Export Citation:
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Assignee:
ソニー株式会社
International Classes:
H01L21/66; G01B11/30; G01N21/956
Domestic Patent References:
JP11237345A
JP10047949A
JP2004507101A
Foreign References:
WO2003028089A1
Attorney, Agent or Firm:
Junichi Omori