Title:
非破壊検査方法及び非破壊検査装置
Document Type and Number:
Japanese Patent JP5032201
Kind Code:
B2
Inventors:
Koichi Nitto
Kadokawa Kiyoharu
Hitoshi Sakai
Kunihiko Nakayama
Kadokawa Kiyoharu
Hitoshi Sakai
Kunihiko Nakayama
Application Number:
JP2007135813A
Publication Date:
September 26, 2012
Filing Date:
May 22, 2007
Export Citation:
Assignee:
Toshiba Corporation
International Classes:
G01N23/04; G01N23/05
Domestic Patent References:
| JP10091779A | ||||
| JP2003202382A | ||||
| JP2001307069A | ||||
| JP10216116A | ||||
| JP11296680A | ||||
| JP2001320628A | ||||
| JP8212341A |
Attorney, Agent or Firm:
Patent Business Corporation Sakura International Patent Office
Saichi Suyama
Yukio Kawahara
Satoshi Yamashita
Hideaki Suyama
Saichi Suyama
Yukio Kawahara
Satoshi Yamashita
Hideaki Suyama