Title:
ビーム調整システム
Document Type and Number:
Japanese Patent JP5392982
Kind Code:
B2
Abstract:
The present invention provides an x-ray beam conditioning system with a Kirkpatrick-Baez diffractive optic including two optical elements, of which one of the optical elements is a crystal. The elements are arranged in a side-by-side configuration. The crystal can be a perfect crystal. One or both diffractive elements can be mosaic crystals. One element can be a multilayer optic. For example, the multilayer optic can be an elliptical mirror or a parabolic mirror with graded d-spacing. The graded d-spacing can be either lateral grading or depth grading, or both.
Inventors:
Borman, Boris
Jinpei Harada
Jinpei Harada
Application Number:
JP2006533695A
Publication Date:
January 22, 2014
Filing Date:
June 10, 2004
Export Citation:
Assignee:
Osmic, Inc.
International Classes:
G21K1/06; A61N5/10; G02B26/08
Domestic Patent References:
| JP2003517568A | ||||
| JP2000338061A | ||||
| JP9222401A | ||||
| JP2002504692A |
Other References:
U. Bonse, C. Riekel and A. A. Snigrev,KirkPatrick-baez microprobe on the basis of two linear sugle crystal Bragg-Fresnell lenses,Rev. Sci. Instrum ,米国,American Institute of Physics,1992年 1月,Vol. 63, No. 1,622-624
Attorney, Agent or Firm:
Asamura patent office