Title:
サンプルレート差を測定するためのデバイスおよび方法
Document Type and Number:
Japanese Patent JP5548262
Kind Code:
B2
Abstract:
In embodiments, a device is illustrated for determining a sample rate difference between a first information signal and a second information signal including an offset determiner for determining for each of a plurality of segments of the first information signal, associated offset values which temporally align the plurality of segments with respect to the second information signal and a calculator for calculating the sample rate difference on the basis of the offset values.
Inventors:
シュミットマー Christiane
Bit Lorant
Keel Michael
Bit Lorant
Keel Michael
Application Number:
JP2012516599A
Publication Date:
July 16, 2014
Filing Date:
May 05, 2010
Export Citation:
Assignee:
Opti Qom ディプ loam * in -- genie -- エーア Michael Keel ゲーエムベーハー
International Classes:
H04N17/00; G10L25/69
Attorney, Agent or Firm:
Zenkei Okada
Ogiya 1
Ogiya 1