イオン又は後にイオン化される中性粒子を試料から検出する方法、質量分析計、及びその使用

Title:

イオン又は後にイオン化される中性粒子を試料から検出する方法、質量分析計、及びその使用

Document Type and Number:

Japanese Patent JP5695193

Kind Code:

B2

Abstract:

The present invention relates to a method and to a mass spectrometer and uses thereof for detecting ions or subsequently-ionised neutral particles from samples. The method for operating a time-of-flight mass spectrometer for analysis of a first pulsed ion beam, the ions of which are disposed along the pulse direction, separated with respect to their ion masses, is characterised in that the ions of at least one individual predetermined ion mass or of at least one predetermined range of ion masses can be decoupled from the first pulsed ion beam as at least one decoupled ion beam and the first ion beam and the at least one decoupled ion beam are analysed.

Inventors:

Niehuis, Ewald

Application Number:

JP2013521018A

Publication Date:

April 01, 2015

Filing Date:

July 28, 2011

Export Citation:

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