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Title:
分光測定装置
Document Type and Number:
Japanese Patent JP5811789
Kind Code:
B2
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Inventors:
Akira Sano
Application Number:
JP2011245517A
Publication Date:
November 11, 2015
Filing Date:
November 09, 2011
Export Citation:
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Assignee:
Seiko Epson Corporation
International Classes:
G01J3/26; G02B26/00
Domestic Patent References:
JP2011150108A
JP2004082697A
JP2008023756A
JP9326757A
JP2002277640A
Foreign References:
US20120013905
US20120212822
US20100097613
Attorney, Agent or Firm:
Intellectual Property Office



 
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