Title:
試験装置および試験モジュール
Document Type and Number:
Japanese Patent JP5841458
Kind Code:
B2
Abstract:
In order to efficiently test a plurality of types of devices under test, provided is a test apparatus that tests a device under test, comprising one or more test modules that each include a plurality of testing sections testing the device under test by exchanging signals with the device under test; and a plurality of control apparatuses that control operation of the testing sections. In each of the one or more test modules, the plurality of testing sections are each allocated to one of the plurality of control apparatuses, and each of the control apparatuses is capable of executing a test program managed by a different user, and controls operation of the testing sections allocated thereto.
Inventors:
Takeshi Yaguchi
Sugimura Hajime
Takahiro Nakajima
Toshiaki Adachi
Sugimura Hajime
Takahiro Nakajima
Toshiaki Adachi
Application Number:
JP2012045889A
Publication Date:
January 13, 2016
Filing Date:
March 01, 2012
Export Citation:
Assignee:
Advantest Corporation
International Classes:
G01R31/28
Domestic Patent References:
| JP2011154025A | ||||
| JP2010085404A | ||||
| JP2011059113A | ||||
| JP2008032732A | ||||
| JP2006266835A |
Foreign References:
| WO2011001462A1 |
Attorney, Agent or Firm:
Longhua International Patent Service Corporation